Sequential circuit test pattern generation using empirical partial scan and distributed computation

Autor:	Kim, Kee Sup.
Jazyk:	angličtina
Rok vydání:	1992
Popis:	Thesis (Ph. D.)--University of Wisconsin--Madison, 1992. Typescript. eContent provider-neutral record in process. Description based on print version record. Includes bibliographical references (leaves 159-166).
Databáze:	Networked Digital Library of Theses & Dissertations
Externí odkaz:	http://catalog.hathitrust.org/api/volumes/oclc/28727669.html Zobrazit plný text záznamu