Reliability and test of high-performance integrated circuits
| Autor: | Mohanram, Kartik. |
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| Jazyk: | angličtina |
| Rok vydání: | 2003 |
| Předmět: | |
| Popis: | Thesis (Ph. D.)--University of Texas at Austin, 2003. Vita. Includes bibliographical references. Available also from UMI Company. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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