Multi-level modeling of total ionizing dose in a-SiO₂ first principles to circuits
Autor: | Nicklaw, Christopher J. |
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Jazyk: | angličtina |
Rok vydání: | 2003 |
Předmět: | |
Druh dokumentu: | Electronic dissertations. |
Popis: | Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, Aug. 2003. Title from title screen. Includes bibliographical references. |
Databáze: | Networked Digital Library of Theses & Dissertations |
Externí odkaz: |