Multi-level modeling of total ionizing dose in a-SiO₂ first principles to circuits

Autor: Nicklaw, Christopher J.
Jazyk: angličtina
Rok vydání: 2003
Předmět:
Druh dokumentu: Electronic dissertations.
Popis: Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, Aug. 2003.
Title from title screen. Includes bibliographical references.
Databáze: Networked Digital Library of Theses & Dissertations