Characterization and application of MeV ion implanted layers in III-V compound semiconductors.
| Autor: | Xiong, Fulin. |
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| Jazyk: | angličtina |
| Rok vydání: | 1990 |
| Zdroj: | Go to Characterization and application of MeV ion implanted layers in III-V compound semiconductors [electronic thesis]. |
| Druh dokumentu: | Electronic dissertations. |
| Popis: | Thesis (Ph. D.). UM #90-22,298. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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