DC Hot Carrier Reliability at Elevated Temperatures for nMOSFETs Using 0.13Mum Technology
| Autor: | Ze-Wei, Jhou |
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| Jazyk: | angličtina |
| Rok vydání: | 2005 |
| Popis: | Thesis (M.A.)--National Taipei University of Technology Graduate Institute of Mechatronic Engineering Includes bibliographical references |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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