Nanoscale characterization of solution-cast poly (vinylidene fluoride) thinfilms using atomic force microscopy

Autor:	Jee, Tae Kwon
Jazyk:	angličtina
Rok vydání:	2007
Předmět:	Major Mechanical Engineering
Popis:	Thesis (M. S.)--Texas A&M University, 2005. "Major Subject: Mechanical Engineering" Title from author supplied metadata (automated record created on Apr. 27, 2007.) Vita. Abstract. Includes bibliographical references.
Databáze:	Networked Digital Library of Theses & Dissertations
Externí odkaz:	http://handle.tamu.edu/1969.1/4790 Zobrazit plný text záznamu