Noise, Resolution and Entropy in Sputter Profiling

Autor:	Dowsett, M. G., Collins, R.
Zdroj:	Philosophical Transactions: Mathematical, Physical and Engineering Sciences, 1996 Nov . 354(1719), 2713-2729.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/54737 Zobrazit plný text záznamu