Exposure Reconstruction and Risk Analysis for Six Semiconductor Workers With Lymphohematopoietic Cancers

Autor:	Jones, Rachael M., Dell, Linda, Torres, Craig, Simmons, Catherine E., Poole, James, Boelter, Fred W., Harper, Paul
Zdroj:	Journal of Occupational and Environmental Medicine, 2015 Jun 01. 57(6), 649-658.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/48500590 Zobrazit plný text záznamu