Functional Characterization of Surface Roughness Generated by Plateau Honing Process Using Wavelet Analysis

Autor:	Lu, Shengfeng, Iyer, Kaushik, Hu, S. Jack
Zdroj:	SAE Transactions, 2004 Jan 01. 113, 712-718.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/44699989 Zobrazit plný text záznamu