Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging

Autor:	Boulanger, Jérôme, Gueudry, Charles, Münch, Daniel, Cinquin, Bertrand, Paul-Gilloteaux, Perrine, Bardin, Sabine, Guérin, Christophe, Senger, Fabrice, Blanchoin, Laurent, Salamero, Jean
Zdroj:	Proceedings of the National Academy of Sciences of the United States of America, 2014 Dec 01. 111(48), 17164-17169.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/43278632 Zobrazit plný text záznamu