Direct Measurement of Interatomic Force Gradients Using an Ultra-Low-Amplitude Atomic Force Microscope

Autor:	Hoffmann, Peter M., Oral, Ahmet, Grimble, Ralph A., Özer, H. Özgür, Jeffery, Steve, Pethica, John B.
Zdroj:	Proceedings: Mathematical, Physical and Engineering Sciences, 2001 May 01. 457(2009), 1161-1174.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/3067309 Zobrazit plný text záznamu