Stress measurement in East Asian lacquer thin films owing to changes in relative humidity using phase-shifting interferometry

Autor:	Elmahdy, A. E., Ruiz, P. D., Wildman, R. D., Huntley, J. M., Rivers, S.
Zdroj:	Proceedings: Mathematical, Physical and Engineering Sciences, 2011 May 01. 467(2129), 1329-1347.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/29792793 Zobrazit plný text záznamu