Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques

Autor:	Ilett, Martha, S’ari, Mark, Freeman, Helen, Aslam, Zabeada, Koniuch, Natalia, Afzali, Maryam, Cattle, James, Hooley, Robert, Roncal-Herrero, Teresa, Collins, Sean M., Hondow, Nicole, Brown, Andy, Brydson, Rik
Zdroj:	Philosophical Transactions: Mathematical, Physical and Engineering Sciences, 2020 Dec 01. 378(2186), 1-24.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/27001779 Zobrazit plný text záznamu