Combining Band Recovery Data and Pollock's Robust Design to Model Temporary and Permanent Emigration
Autor: | Lindberg, M. S., Kendall, W. L., Hines, J. E., Anderson, Michael G. |
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Zdroj: | Biometrics, 2001 Mar 01. 57(1), 273-281. |
Databáze: | JSTOR Journals |
Externí odkaz: |