Design and Analysis of Accelerated Tests for Mission-Critical Reliability Michael J. LuValle Bruce G. Lefevre SriRaman Kannan
| Autor: | Ding, Yu |
|---|---|
| Zdroj: | Technometrics, 2005 May 01. 47(2), 240-241. |
| Databáze: | JSTOR Journals |
| Externí odkaz: |
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| Autor: | Ding, Yu |
|---|---|
| Zdroj: | Technometrics, 2005 May 01. 47(2), 240-241. |
| Databáze: | JSTOR Journals |
| Externí odkaz: |
|