Tilt Scanning Interferometry: A Novel Technique for Mapping Structure and Three-Dimensional Displacement Fields within Optically Scattering Media
Autor: | Ruiz, Pablo D., Huntley, Jonathan M., Maranon, Alejandro |
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Zdroj: | Proceedings: Mathematical, Physical and Engineering Sciences, 2006 Aug 01. 462(2072), 2481-2502. |
Databáze: | JSTOR Journals |
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