Tilt Scanning Interferometry: A Novel Technique for Mapping Structure and Three-Dimensional Displacement Fields within Optically Scattering Media

Autor: Ruiz, Pablo D., Huntley, Jonathan M., Maranon, Alejandro
Zdroj: Proceedings: Mathematical, Physical and Engineering Sciences, 2006 Aug 01. 462(2072), 2481-2502.
Databáze: JSTOR Journals