Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-To-Lot Variability

Autor:	Ou, Jihong, Wein, Lawrence M.
Zdroj:	Operations Research, 1996 Jan 01. 44(1), 196-205.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/171914 Zobrazit plný text záznamu