Aluminum-Induced Plasma Membrane Surface Potential and H + -ATPase Activity in Near-Isogenic Wheat Lines Differing in Tolerance to Aluminum

Autor: Ahn, S. J., Rengel, Z., Matsumoto, H.
Zdroj: The New Phytologist, 2004 Apr 01. 162(1), 71-79.
Databáze: JSTOR Journals
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