Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing

Autor:	Baron, Michael, Lakshminarayan, Choudur K., Chen, Zhenwu
Zdroj:	Technometrics, 2001 Feb 01. 43(1), 66-72.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/1270858 Zobrazit plný text záznamu