Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance

Autor:	Kim, B.F., Bohandy, J., Adrian, F.J., Phillips, T.E., Moorjani, K.
Zdroj:	Microelectronics International: An International Journal, 1991, Vol. 8, Issue 1, pp. 16-19.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/eb044433 Zobrazit plný text záznamu