SIMULATION OF COUPLED IMPURITIES DIFFUSION UNDER OXIDIZING CONDITIONS. APPLICATION TO THE OPTIMIZATION OF THE p‐WELLS IN CMOS TECHNOLOGY
Autor: | DEPEURSINGE, Y., GUEX, L., MORET, J.M., WEISS, P. |
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Zdroj: | COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 1983, Vol. 2, Issue 4, pp. 149-160. |
Databáze: | Emerald Insight |
Externí odkaz: |