The Law and Economics of Patent Damages, Antitrust, and the Legal Process

Autor:	Langenfeld, James, Fagan, Frank
Zdroj:	The Law and Economics of Patent Damages, Antitrust, and Legal Process
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/S0193-589520210000029001 Zobrazit plný text záznamu