Relationship between resistance, TCR and stabilization temperature of amorphous Ni-P alloy
Autor: | Filipowski, Wojciech, Pruszowski, Zbigniew, Waczynski, Krzysztof, Kowalik, Piotr, Kulawik, Jan |
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Zdroj: | Microelectronics International, 2017, Vol. 34, Issue 3, pp. 154-159. |
Databáze: | Emerald Insight |
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