Relationship between resistance, TCR and stabilization temperature of amorphous Ni-P alloy

Autor:	Filipowski, Wojciech, Pruszowski, Zbigniew, Waczynski, Krzysztof, Kowalik, Piotr, Kulawik, Jan
Zdroj:	Microelectronics International, 2017, Vol. 34, Issue 3, pp. 154-159.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/MI-12-2016-0090 Zobrazit plný text záznamu