Study on electronic transport performance of Ag-ZnO film by photoassisted conductive atomic force microscopy

Autor:	Zhang, Yidong
Zdroj:	Microelectronics International, 2023, Vol. 41, Issue 2, pp. 103-108.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/MI-02-2023-0017 Zobrazit plný text záznamu