The tunnelling and electron injection reliabilities for FG transistors

Autor:	C. Mabuza, Bongani, Sinha, Saurabh
Zdroj:	Microelectronics International, 2014, Vol. 31, Issue 2, pp. 108-115.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/MI-01-2013-0001 Zobrazit plný text záznamu