Analysis of surface insulation resistance related failures in electronics by circuit simulation

Autor:	Verdingovas, Vadimas, Joshy, Salil, Jellesen, Morten Stendahl, Ambat, Rajan
Zdroj:	Circuit World, 2017, Vol. 43, Issue 2, pp. 45-55.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/CW-09-2016-0040 Zobrazit plný text záznamu