Characterization of a novel 10T SRAM cell with improved data stability and delay performance for 20-nm tri-gated FinFET technology
| Autor: | Limachia, Mitesh Jethabhai, Thakker, Rajesh A., Kothari, Nikhil J. |
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| Zdroj: | Circuit World, 2018, Vol. 44, Issue 4, pp. 187-194. |
| Databáze: | Emerald Insight |
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