A comprehensive approach to single and double line contingency screening

Autor:	Montagna, Mario
Zdroj:	COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2016, Vol. 35, Issue 5, pp. 1672-1684.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/COMPEL-09-2015-0354 Zobrazit plný text záznamu