Outage and BER analysis of dual-carrier modulation over frequency-selective Nakagami-m fading channels

Autor:	Kondoju, Sai Krishna, Mani, V.V.
Zdroj:	COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2017, Vol. 36, Issue 1, pp. 90-107.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/COMPEL-03-2016-0097 Zobrazit plný text záznamu