Thick‐film strain gauges on alumina, zirconia and steel substrates

Autor:	Belavic, Darko, Hrovat, Marko, Santo Zarnik, Marina, Bencan, Andreja, Smetana, Walter, Reicher, Roland, Homolka, Heinz
Zdroj:	Microelectronics International: An International Journal, 2003, Vol. 20, Issue 2, pp. 41-45.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/13565360310472194 Zobrazit plný text záznamu