Support vector machines for measuring dielectric properties of materials

Autor: Hacib, T., Acikgoz, H., Le Bihan, Y., Mekideche, M.R., Meyer, O., Pichon, L.
Přispěvatelé: Wiak, Sławomir, Napieralska‐Juszczak, Ewa
Zdroj: COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2010, Vol. 29, Issue 4, pp. 1081-1089.
Databáze: Emerald Insight