Support vector machines for measuring dielectric properties of materials
Autor: | Hacib, T., Acikgoz, H., Le Bihan, Y., Mekideche, M.R., Meyer, O., Pichon, L. |
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Přispěvatelé: | Wiak, Sławomir, Napieralska‐Juszczak, Ewa |
Zdroj: | COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2010, Vol. 29, Issue 4, pp. 1081-1089. |
Databáze: | Emerald Insight |
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