Using of EM fields during industrial CZ and FZ large silicon crystal growth

Autor:	Mühlbauer, Alfred, Muiznieks, Andris, Ratnieks, Gundars, Krauze, Armands, Raming, Georg, Wetzel, Thomas
Zdroj:	COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2003, Vol. 22, Issue 1, pp. 123-133.
Databáze:	Emerald Insight
Externí odkaz:	http://www.emeraldinsight.com/doi/10.1108/03321640310452222 Zobrazit plný text záznamu