An experimental comparison of interface trap density in hafnium oxide-based FeFETs
| Autor: | Woo, Chaiwon, Raffel, Yannick, Olivo, Ricardo, Seidel, Konrad, Gurlo, Aleksander |
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| Zdroj: | In Memories - Materials, Devices, Circuits and Systems December 2023 6 |
| Databáze: | ScienceDirect |
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