Ge-friendly gate stacks: Initial property and long-term reliability
| Autor: | Tang, Xiaoyu, Zhu, Rongjia, Liu, Yujie, Han, Zhezhe |
|---|---|
| Zdroj: | In Micro and Nanostructures November 2024 195 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Tang, Xiaoyu, Zhu, Rongjia, Liu, Yujie, Han, Zhezhe |
|---|---|
| Zdroj: | In Micro and Nanostructures November 2024 195 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect