The role of process and geometrical parameters of gate stack Inverted-T shape junction less FET at 20 nm technology node

Autor: Munjal, Sameeksha, Rup Prakash, Neelam, Kaur, Jasbir, Komal
Zdroj: In Micro and Nanostructures September 2024 193
Databáze: ScienceDirect