Potential model and simulation analysis of dual material gate vertical TFET with impact of interface trap charges
| Autor: | Kalai Selvi, K., Dhanalakshmi, K.S., Padmavathi, R. Anusha |
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| Zdroj: | In Micro and Nanostructures December 2022 172 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect