TCAD simulation of vertical diamond MISFET based on deep depletion characteristics with high current output capacity

Autor: Xu, Pengfei, Jin, Peng, Feng, Mengyang, Qu, Pengfei, Huo, Xiaodi, Wu, Ju, Wang, Zhanguo
Zdroj: In Micro and Nanostructures September 2022 169
Databáze: ScienceDirect