Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon
| Autor: | de Kruijf, Mathieu, Noah, Grayson M., Gomez-Saiz, Alberto, Morton, John J.L., Gonzalez-Zalba, M. Fernando |
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| Zdroj: | In Chip September 2024 3(3) |
| Databáze: | ScienceDirect |
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