Novel source/drain contact structure for a-IGZO devices: Oxygen-scavenger-layer metal-interlayer-semiconductor (OSL MIS) approach

Autor: Song, Sungjoo, Kim, Jong-Hyun, Park, Jongyoun, Kim, Seung-Hwan, Ko, Dongjin, Choi, Hyejung, Kim, Seiyon, Yu, Hyun-Yong
Zdroj: In Applied Surface Science Advances January 2025 25
Databáze: ScienceDirect