Revealing interfacial degradation of Bi2Te3-based micro thermoelectric device under current shocks

Autor: Lyu, Jianan, Yang, Dongwang, Zhang, Mingqi, Liu, Yutian, Wang, Ziao, Zhang, Zinan, Zhan, Gang, Li, Chenyang, Wang, Yuting, Gou, Weijie, Gao, Yunfei, Li, Chengyu, Wu, Jinsong, Tang, Xinfeng, Yan, Yonggao
Zdroj: In Materials Today Physics November 2024 48
Databáze: ScienceDirect