Stretch-tolerant interconnects derived from silanization-assisted capping layer lamination for smart skin-attachable electronics

Autor: Zheng, Zetao, Huang, Zhuobin, Zhang, Nian, Liu, Shiyu, Zhao, Lingyu, Li, Xingyi, Wang, Liu, Xu, Fang, Shi, Jidong
Zdroj: In Materials Today Physics August 2024 46
Databáze: ScienceDirect