A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices
| Autor: | Lin, C.-Y., Chen, P.-H., Chang, T.-C., Huang, W.-C., Tan, Y.-F., Lin, Y.-H., Chen, W.-C., Lin, C.-C., Chang, Y.-F., Chen, Y.-C., Huang, H.-C., Ma, X.-H., Hao, Y., Sze, S.M. |
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| Zdroj: | In Materials Today Physics June 2020 13 |
| Databáze: | ScienceDirect |
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