New insights into CoFe/n-Si interfacial structure as probed by X-ray photoelectron spectroscopy
| Autor: | Kumar, Arvind, Shripathi, T., Srivastava, P.C. |
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| Zdroj: | In Journal of Science: Advanced Materials and Devices September 2016 1(3):290-294 |
| Databáze: | ScienceDirect |
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