Electromagnetic interference shielding performance and structure of multilayered NiFe/Cu thin films: Effects of impedance and defects
| Autor: | Kwon, Hyun Jun, Park, Jong-Hwan, Park, JungHo, Shin, Se Hee, Kim, Ki Hyeon, Suh, Su Jeong |
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| Zdroj: | In Surfaces and Interfaces July 2024 50 |
| Databáze: | ScienceDirect |
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