Data-driven Prognostic Approaches for Semiconductor Manufacturing Process: A Review of Recent Works and Future Perspectives

Autor: JAMAL, Dima EL, ANANOU, Bouchra, GRATON, Guillaume, OULADSINE, Mustapha, PINATON, Jacques
Zdroj: In IFAC PapersOnLine 2023 56(2):3716-3724
Databáze: ScienceDirect