Image-Based Parametric Pattern Recognition for Micro- and Nano- Defect Detection
| Autor: | Belikov, Sergey ⁎, Su, Chanmin ⁎⁎, Enachescu, Marian ⁎⁎⁎ |
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| Zdroj: | In IFAC PapersOnLine 2020 53(2):8591-8598 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Belikov, Sergey ⁎, Su, Chanmin ⁎⁎, Enachescu, Marian ⁎⁎⁎ |
|---|---|
| Zdroj: | In IFAC PapersOnLine 2020 53(2):8591-8598 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|