Virtual metrology on semiconductor manufacturing based on Just-in-time learning
| Autor: | Jebri, M.A., El Adel, E.M., Graton, G., Ouladsine, M., Pinaton, J. |
|---|---|
| Zdroj: | In IFAC PapersOnLine 2016 49(12):89-94 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Jebri, M.A., El Adel, E.M., Graton, G., Ouladsine, M., Pinaton, J. |
|---|---|
| Zdroj: | In IFAC PapersOnLine 2016 49(12):89-94 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|