Tantalum-doped tin oxide thin films using hollow cathode gas flow sputtering technology

Autor: Huo, Fangfang, Muydinov, Ruslan, Seibertz, Bertwin Bilgrim Otto, Wang, Can, Hartig, Manuel, Alktash, Nivin, Gao, Peng, Szyszka, Bernd
Zdroj: In Heliyon 30 May 2024 10(10)
Databáze: ScienceDirect