Characterization of nanoscale atomic motion of Si in polycrystalline Cu layer
| Autor: | Takáts, Viktor, Bodnár, Eszter, Kaganovskii, Yuri, Fodor, Tamás, Hakl, József, Molnár, Sándor, Soha, Márton, Vad, Kálmán |
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| Zdroj: | In Heliyon 15 February 2024 10(3) |
| Databáze: | ScienceDirect |
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