High resolution spin-on electron beam lithography resist with exceptional dry etching resistance
Autor: | Grenci, G., Zanchetta, E., Pozzato, A., Della Giustina, G., Brusatin, G., Tormen, M. |
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Zdroj: | In Applied Materials Today November 2015 1(1):13-19 |
Databáze: | ScienceDirect |
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